Cunha, L., Vaz, F., Moura, C., Munteanu, D., Ionescu, C., Rivière, J. P., & Le Bourhis, E. (2010). Ti–Si–C thin films produced by magnetron sputtering: Correlation between physical properties, mechanical properties and tribological behavior.
Citação norma ChicagoCunha, L., F. Vaz, C. Moura, D. Munteanu, C. Ionescu, J. P. Rivière, and E. Le Bourhis. Ti–Si–C Thin Films Produced by Magnetron Sputtering: Correlation Between Physical Properties, Mechanical Properties and Tribological Behavior. 2010.
Citação norma MLACunha, L., et al. Ti–Si–C Thin Films Produced by Magnetron Sputtering: Correlation Between Physical Properties, Mechanical Properties and Tribological Behavior. 2010.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.