Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy

Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to...

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Bibliographic Details
Main Author: Romanyuk, Konstantin (author)
Other Authors: Luchkin, Sergey Yu. (author), Ivanov, Maxim (author), Kalinin, Arseny (author), Kholkin, Andrei L. (author)
Format: article
Language:eng
Published: 1000
Subjects:
ATOMIC-FORCE MICROSCOPY
ELECTROCHEMICAL STRAIN MICROSCOPY
THERMAL NOISE
NANOSCALE
SPECTROSCOPY
CANTILEVERS
DIFFUSION
ANODES
SOLIDS
LIMIT
Online Access:http://hdl.handle.net/10773/20337
Country:Portugal
Oai:oai:ria.ua.pt:10773/20337

Internet

http://hdl.handle.net/10773/20337

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