Near-edge X-ray absorption spectroscopy signature of image potential states in multilayer epitaxial graphene.

Single layer behavior in multilayer epitaxial graphene has been a matter of intense investigation. This is due to the layer decoupling that occurs during growth of graphene on some types of substrates, such as carbonterminated silicon carbide. We show here that near-edge X-ray absorption spectroscop...

Full description

Bibliographic Details
Main Author: Coelho Neto, Paula Maciel (author)
Other Authors: Reis, Diogo Duarte dos (author), Matos, Matheus Josué de Souza (author), Sá, Thiago Grasiano Mendes de (author), Gonçalves, Além Mar Bernardes (author), Lacerda, Rodrigo Gribel (author), Souza, Angelo Malachias de (author), Paniago, Rogério Magalhães (author)
Format: article
Language:por
Published: 2016
Subjects:
Graphene
Graphite
Spectroscopy
Diffraction
Online Access:https://doi.org/10.1016/j.susc.2015.10.016
Country:Brazil
Oai:oai:localhost:123456789/7079

Internet

https://doi.org/10.1016/j.susc.2015.10.016

Similar Items