Defect Characterization With Eddy Current Testing Using Nonlinear-Regression Feature Extraction and Artificial Neural Networks

Bibliographic Details
Main Author: Rosado, Luis (author)
Other Authors: Janeiro, Fernando M. (author), Ramos, Pedro M. (author), Piedade, Moisés (author)
Format: article
Language:eng
Published: 2013
Subjects:
Artificial neural networks (ANNs)
defect parameter estimation
eddy current testing (ECT)
feature extraction
nonlinear regression
Online Access:http://hdl.handle.net/10174/9619
Country:Brazil
Oai:oai:dspace.uevora.pt:10174/9619

Internet

http://hdl.handle.net/10174/9619

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