X-ray computed (micro) tomography for detecting internal defects in fruit

Proceedings of the International Conference “Environmentally friendly and safe technologies for quality of fruit and vegetables”, held in Universidade do Algarve, Faro, Portugal, on January 14-16, 2009. This Conference was a join activity with COST Action 924.

Detalhes bibliográficos
Autor principal: Verboven, Pieter (author)
Outros Autores: Tri Ho, Quang (author), Herremans, Els (author), Lammertyn, Jeroen (author), Nicolaï, Bart (author)
Formato: bookPart
Idioma:eng
Publicado em: 2013
Texto completo:http://hdl.handle.net/10400.1/2915
País:Portugal
Oai:oai:sapientia.ualg.pt:10400.1/2915