Lourenço, P., Fantoni, A., Costa, J., & Vieira, M. (2019). Lithographic mask defects analysis on an MMI 3 dB splitter.
Chicago Style (17th ed.) CitationLourenço, Paulo, Alessandro Fantoni, João Costa, and Manuela Vieira. Lithographic Mask Defects Analysis on an MMI 3 DB Splitter. 2019.
MLA (8th ed.) CitationLourenço, Paulo, et al. Lithographic Mask Defects Analysis on an MMI 3 DB Splitter. 2019.
Warning: These citations may not always be 100% accurate.