The role of microstructure in luminescent properties of Er-doped nanocrystalline Si thin films

In this contribution, we present a structural and photoluminescence (PL) analysis of Er-doped nanocrystalline silicon thin films produced by rf magnetron sputtering method. We show the strong influence of the presence of nanocrystalline fraction in films on their luminescence efficiency at 1.54 micr...

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Bibliographic Details
Main Author: Stepikhova, M. (author)
Other Authors: Cerqueira, M. F. (author), Losurdo, M. (author), Giangregorio, M. M. (author), Alves, E. (author), Monteiro, T. (author), Soares, Manuel Jorge (author)
Format: article
Language:eng
Published: 2004
Subjects:
Photoluminescence
Erbium
Nanocrystalline silicon
Ellipsometry
Science & Technology
Online Access:http://hdl.handle.net/1822/13985
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/13985

Internet

http://hdl.handle.net/1822/13985

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