Kachkanov, V., Dolbnya, I., O'Donnell, K., Lorenz, K., Pereira, S., Watson, I., . . . Parbrook, P. (1000). Characterisation of III-nitride materials by synchrotron X-ray microdiffraction reciprocal space mapping.
Chicago Style (17th ed.) CitationKachkanov, Vyacheslav, et al. Characterisation of III-nitride Materials by Synchrotron X-ray Microdiffraction Reciprocal Space Mapping. 1000.
MLA (8th ed.) CitationKachkanov, Vyacheslav, et al. Characterisation of III-nitride Materials by Synchrotron X-ray Microdiffraction Reciprocal Space Mapping. 1000.
Warning: These citations may not always be 100% accurate.