IEEE Std 1149.7: What, Why, Where?

The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when used along with other IEEE standards (particularly those that use the IEEE Std 1149.1 for test access and control). In this paper we describe what is the IEEE Std 1149.7, the reasons why we may consider...

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Bibliographic Details
Main Author: José Martins Ferreira (author)
Other Authors: Francisco R. Fernandes (author), Ricardo J. S. Machado (author), Manuel G. O. Gericota (author)
Format: book
Language:eng
Published: 2012
Subjects:
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Online Access:https://hdl.handle.net/10216/84051
Country:Portugal
Oai:oai:repositorio-aberto.up.pt:10216/84051
Description
Summary:The IEEE Std 1149.7 holds the promise of great improvements for testing electronic circuits, when used along with other IEEE standards (particularly those that use the IEEE Std 1149.1 for test access and control). In this paper we describe what is the IEEE Std 1149.7, the reasons why we may consider to use it instead of IEEE Std 1149.1, and we highlight the application spectrum where this new standard can be useful.

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