Radiation-damage recovery in undoped and oxidized Li doped MgO crystals implanted with lithium ions

Undoped MgO and oxidized Li-doped MgO single crystals were implanted with 1×1017 Li+/cm2 at 175 keV. The Rutherford backscattering spectrometry (RBS)/channeling data obtained after implantation shows that damage was produced throughout the entire range of the implanted ions. Optical absorption measu...

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Detalhes bibliográficos
Autor principal: Alves, E. (author)
Outros Autores: Silva, R.C. (author), Pinto, J.V. (author), Monteiro, T. (author), Savoini, B. (author), Cáceres, D. (author), González, R. (author), Chen, Y. (author)
Formato: article
Idioma:eng
Publicado em: 1000
Assuntos:
Texto completo:http://hdl.handle.net/10773/6523
País:Portugal
Oai:oai:ria.ua.pt:10773/6523