Radiation-damage recovery in undoped and oxidized Li doped MgO crystals implanted with lithium ions
Undoped MgO and oxidized Li-doped MgO single crystals were implanted with 1×1017 Li+/cm2 at 175 keV. The Rutherford backscattering spectrometry (RBS)/channeling data obtained after implantation shows that damage was produced throughout the entire range of the implanted ions. Optical absorption measu...
Autor principal: | |
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Outros Autores: | , , , , , , |
Formato: | article |
Idioma: | eng |
Publicado em: |
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Assuntos: | |
Texto completo: | http://hdl.handle.net/10773/6523 |
País: | Portugal |
Oai: | oai:ria.ua.pt:10773/6523 |