Low-Power In-Circuit testing of a LNA
A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault...
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| Formato: | book |
| Idioma: | eng |
| Publicado em: |
2005
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| Texto completo: | https://repositorio-aberto.up.pt/handle/10216/71539 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/71539 |
| Resumo: | A new technique is proposed to tackle in-circuit testing of embedded RF blocks. It relies on observing the cross-correlation between its output voltage and power supply current, using a translinear cross-correlator circuit. Although a structural test is performed, simulation results show that fault detection criteria can be established based on acceptable deviations of performance characterization parameters. The case of a Low Noise Amplifier is presented. |
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