Chemical and structural characterization of ZrCNAg coatings: XPS, XRD and Raman spectroscopy

In this report Zr C N Ag coatings produced by dual magnetron sputtering are characterized by X-ray photoelectron spectroscopy (XPS) and complemented byX-ray diffraction, scanning electron microscopy, electron-probe microanalysis and Raman spectroscopy, in order to determine the chemical bonds and ph...

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Detalhes bibliográficos
Autor principal: Velasco, Sebastian Calderon (author)
Outros Autores: Cavaleiro, A. (author), Carvalho, S. (author)
Formato: article
Idioma:eng
Publicado em: 2015
Assuntos:
Texto completo:http://hdl.handle.net/1822/50192
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/50192