A comparative analysis of fault injection methods via enhanced on-chip debug infrastructures

On-chip debug (OCD) features are frequently available in modern microprocessors. Their contribution to shorten the time-to-market justifies the industry investment in this area, where a number of competing or complementary proposals are available or under development, e.g. NEXUS, CJTAG, IJTAG. The c...

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Bibliographic Details
Main Author: André Fidalgo (author)
Other Authors: G. Alves (author), Manuel G. Gericota (author), J. M. Martins Ferreira (author)
Format: book
Language:eng
Published: 2008
Subjects:
Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electronic engineering, Information engineering
Online Access:https://hdl.handle.net/10216/84662
Country:Portugal
Oai:oai:repositorio-aberto.up.pt:10216/84662

Internet

https://hdl.handle.net/10216/84662

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