On-line self-healing of circuits implemented on reconfigurable FPGAs
To boost logic density and reduce per unit power consumption SRAM-based FPGAs manufacturers adopted nanometric technologies. However, this technology is highly vulnerable to radiation-induced faults, which affect values stored in memory cells, and to manufacturing imperfections. Fault tolerant imple...
| Autor principal: | |
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| Outros Autores: | , , |
| Formato: | book |
| Idioma: | eng |
| Publicado em: |
2007
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| Assuntos: | |
| Texto completo: | https://hdl.handle.net/10216/84623 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/84623 |