Cd and Cu interdiffusion in Cu(In,Ga)Se2/CdS hetero-interfaces
We report a detailed characterization of an industry-like prepared Cu(In,Ga)Se2 (CIGS)/CdS heterojunction by scanning transmission electron microscopy (STEM) and photoluminescence (PL). Energy dispersive x-ray spectroscopy (EDS) shows the presence of several regions in the CIGS layer that are Cu dep...
Autor principal: | |
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Outros Autores: | , , , , , , , , |
Formato: | article |
Idioma: | eng |
Publicado em: |
2021
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Assuntos: | |
Texto completo: | http://hdl.handle.net/10773/30565 |
País: | Portugal |
Oai: | oai:ria.ua.pt:10773/30565 |