Combined in-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy study of the effect of deposition pressure and substrate bias on the electrical properties and composition of Ga-doped ZnO thin films grown by magnetron sputtering

This work reports the effect of the applied substrate bias and deposition pressure on the bulk composition, electrical and microstructural properties of Gallium-doped Zinc Oxide thin films deposited by DC magnetron sputtering. In-depth Time-of-Flight Secondary Ion Mass Spectrometry and X-ray Photoel...

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Bibliographic Details
Main Author: Correia, Filipe Costa (author)
Other Authors: Ribeiro, Joana Margarida Fernandes Silva (author), Salvador, Paulo Miguel Babo Cunha (author), Welle, Alexander (author), Bruns, Michael (author), Mendes, Adélio (author), Tavares, C. J. (author)
Format: article
Language:eng
Published: 2018
Subjects:
Thin films
Transparent conductive oxide
Gallium-doped zinc oxide
In-depth composition
Electrical properties
Science & Technology
Online Access:http://hdl.handle.net/1822/72415
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/72415

Internet

http://hdl.handle.net/1822/72415

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