APA (7th ed.) Citation

Correia, F. C., Ribeiro, J. M. F. S., Salvador, P. M. B. C., Welle, A., Bruns, M., Mendes, A., & Tavares, C. J. (2018). Combined in-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy study of the effect of deposition pressure and substrate bias on the electrical properties and composition of Ga-doped ZnO thin films grown by magnetron sputtering.

Chicago Style (17th ed.) Citation

Correia, Filipe Costa, Joana Margarida Fernandes Silva Ribeiro, Paulo Miguel Babo Cunha Salvador, Alexander Welle, Michael Bruns, Adélio Mendes, and C. J. Tavares. Combined In-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy Study of the Effect of Deposition Pressure and Substrate Bias on the Electrical Properties and Composition of Ga-doped ZnO Thin Films Grown by Magnetron Sputtering. 2018.

MLA (8th ed.) Citation

Correia, Filipe Costa, et al. Combined In-depth X-ray Photoelectron Spectroscopy and Time-of-Flight Secondary Ion Mass Spectroscopy Study of the Effect of Deposition Pressure and Substrate Bias on the Electrical Properties and Composition of Ga-doped ZnO Thin Films Grown by Magnetron Sputtering. 2018.