APA (7th ed.) Citation

Correia, F. C., Bundaleski, N., Teodoro, O. M. N. D., Correia, M. R., Rebouta, L., Mendes, A., & Tavares, C. J. (2018). XPS analysis of ZnO: Ga films deposited by magnetron sputtering: substrate bias effect.

Chicago Style (17th ed.) Citation

Correia, Filipe Costa, N. Bundaleski, Omnd M. N. D. Teodoro, M. R. Correia, L. Rebouta, A. Mendes, and C. J. Tavares. XPS Analysis of ZnO: Ga Films Deposited by Magnetron Sputtering: Substrate Bias Effect. 2018.

MLA (8th ed.) Citation

Correia, Filipe Costa, et al. XPS Analysis of ZnO: Ga Films Deposited by Magnetron Sputtering: Substrate Bias Effect. 2018.