Cohesive strength of nanocrystalline ZnO: Ga thin films deposited at room temperature

Transparent conducting nanocrystalline ZnO:Ga (GZO) films with electromechanical and electro-optical properties were deposited by dc magnetron sputtering at room temperature on polymers (and glass for comparison). Electrical resistivity of 8.8x10-4 and 2.2x10-3 Ω.cm was obtained for films deposited...

ver descrição completa

Detalhes bibliográficos
Autor principal: Samantilleke, A. P. (author)
Outros Autores: Rebouta, L. (author), Garim, V. (author), Rubio-Peña, L. (author), Lanceros-Méndez, S. (author), Alpuim, P. (author), Carvalho, S. (author), Kudrin, A. V. (author), Danilov, Yu. A. (author)
Formato: article
Idioma:eng
Publicado em: 2011
Assuntos:
Tensile test
GZO
Cohesive strength
Crack onset strain
Science & Technology
Texto completo:http://hdl.handle.net/1822/12253
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/12253

Texto Completo

http://hdl.handle.net/1822/12253

Registros relacionados