Multi-dimensional modelling of electrostatic forces between atomic force microscopy tip and dielectric surface

In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor...

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Bibliographic Details
Main Author: Boularas, A. (author)
Other Authors: Baudouin, F. (author), Teyssedre, Gilles (author), Villeneuve-Faure, C. (author), Clain, Stéphane (author)
Format: conferencePaper
Language:eng
Published: 2013
Subjects:
Online Access:http://hdl.handle.net/1822/27450
Country:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/27450
Description
Summary:In this paper, simulation results for the electrostatic force between an Atomic Force Microscope (AFM) sensor and the surface of a dielectric are presented for different bias voltages on the tip:. The aim is to analyse force-distance curves as AFM detection mode for electrostatic charges. The sensor is composed of a cantilever supporting a conical tip terminated by a spherical apex; the effect of the cantilever is neglected here. Our model of force curve has been developed using the Finite Volume Method. The scheme is based on the Polynomial Reconstruction Operator – PRO-scheme. First results of the computation of electrostatic force for different tip– sample distances, 0 to 600 nm, and for different DC voltage stress applied to the tip, 6 to 25 V, are shown and compared with experimental data in order to validate our approach.