Macedo, F., Carvalho, P., Cunha, L., Vaz, F., Gibkes, J., Bein, B. K., & Plezl, J. (2009). The role of modulated IR radiometry measurements in the characterization of Zr-O-N thin films.
Chicago Style (17th ed.) CitationMacedo, Francisco, Pedro Carvalho, L. Cunha, F. Vaz, Juergen Gibkes, Bruno K. Bein, and Josef Plezl. The Role of Modulated IR Radiometry Measurements in the Characterization of Zr-O-N Thin Films. 2009.
MLA (8th ed.) CitationMacedo, Francisco, et al. The Role of Modulated IR Radiometry Measurements in the Characterization of Zr-O-N Thin Films. 2009.
Warning: These citations may not always be 100% accurate.