Brown, M. R. (2020). Outlier detection in lithography: Benchmarking and the creation of a new algorithm.
Chicago Style (17th ed.) CitationBrown, Monika Rose. Outlier Detection in Lithography: Benchmarking and the Creation of a New Algorithm. 2020.
MLA (8th ed.) CitationBrown, Monika Rose. Outlier Detection in Lithography: Benchmarking and the Creation of a New Algorithm. 2020.
Warning: These citations may not always be 100% accurate.