Implementation of a DSP Based Impedance Measurement Instrument Using Ellipse Fitting Algorithms
In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for...
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| Outros Autores: | , , |
| Formato: | lecture |
| Idioma: | eng |
| Publicado em: |
2009
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10174/1428 |
| País: | Portugal |
| Oai: | oai:dspace.uevora.pt:10174/1428 |
| Resumo: | In this paper, the DSP implementation of an impedance measurement instrument based on ellipse fitting algorithms is described. The system prototype is based on a commercial DSP kit with few external electronics for baseline assessment and requirements definition. The implemented system is tested for impedance magnitudes from 100 Ω up to 15 kΩ, phases in the ±90º range at 1 kHz measuring frequency with extremely good results. |
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