Integrity checking of 1149.4 extensions to 1149.1
The IEEE 1149.4 Standard for a Mixed-Signal (MS) Test Bus proposes an extension to the well-accepted IEEE 1149.1 boundary-scan test architecture, with the objective of facilitating interconnect, parametric and internal testing of MS circuits. An Analog Test Access Port (ATAP) comprising two pins cal...
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| Other Authors: | , |
| Format: | book |
| Language: | eng |
| Published: |
2006
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| Subjects: | |
| Online Access: | https://hdl.handle.net/10216/84650 |
| Country: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/84650 |