Comparison of Impedance Measurements in a DSP using Ellipse-fit and Seven-Parameter Sine-fit Algorithms
In this paper, two DSP implemented algorithms for impedance measurements are compared. Previously published results demonstrate the usefulness of sine-fit algorithms and ellipse-fit algorithms for impedance measurements where two channels are simultaneously acquired with analog to digital converters...
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| Outros Autores: | , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
2010
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| Assuntos: | |
| Texto completo: | http://hdl.handle.net/10174/2010 |
| País: | Portugal |
| Oai: | oai:dspace.uevora.pt:10174/2010 |