Comparison of Impedance Measurements in a DSP using Ellipse-fit and Seven-Parameter Sine-fit Algorithms

In this paper, two DSP implemented algorithms for impedance measurements are compared. Previously published results demonstrate the usefulness of sine-fit algorithms and ellipse-fit algorithms for impedance measurements where two channels are simultaneously acquired with analog to digital converters...

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Bibliographic Details
Main Author: Ramos, Pedro M. (author)
Other Authors: Janeiro, Fernando M. (author), Radil, Tomas (author)
Format: article
Language:eng
Published: 2010
Subjects:
Online Access:http://hdl.handle.net/10174/2010
Country:Portugal
Oai:oai:dspace.uevora.pt:10174/2010