Gatewaying IEEE 1149.1 and IEEE 1149.7 test access ports

In this paper, we present a description of our developed adapter, which takes acts as a gateway between IEEE 1149.1 and IEEE 1149.7 test infrastructures. The referred adapter reduces the pins of the TAP from 4 to 2 and implements advanced capabilities, such as Parking State of a TAPC and the Reset a...

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Detalhes bibliográficos
Autor principal: José Martins Ferreira (author)
Outros Autores: Francisco R. Fernandes (author), Ricardo J. S. Machado (author), Manuel G. Gericota (author)
Formato: conferenceObject
Idioma:eng
Publicado em: 2012
Assuntos:
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Texto completo:https://hdl.handle.net/10216/84050
País:Portugal
Oai:oai:repositorio-aberto.up.pt:10216/84050
Descrição
Resumo:In this paper, we present a description of our developed adapter, which takes acts as a gateway between IEEE 1149.1 and IEEE 1149.7 test infrastructures. The referred adapter reduces the pins of the TAP from 4 to 2 and implements advanced capabilities, such as Parking State of a TAPC and the Reset and Selection Unit (RSU).

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