Effect of the matrix on the 1.5 microm photoluminescence of Er-doped silicon quantum dots

Erbium doped nanocrystalline silicon thin films were produced by reactive magnetron r.f. sputtering. Their structural and chemical properties were studied by micro-Raman, spectroscopic ellipsometry and Rutherford backscattering spectroscopy. Films with different crystalline fraction and crystallite...

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Detalhes bibliográficos
Autor principal: Cerqueira, M. F. (author)
Outros Autores: Stepikhova, M. (author), Losurdo, M. (author), Monteiro, T. (author), Soares, Manuel Jorge (author), Peres, M. (author), Neves, A. (author), Alves, E. (author)
Formato: conferencePaper
Idioma:eng
Publicado em: 2006
Assuntos:
Silicon QD
Ellipsometry
Photoluminescence
Structure
Science & Technology
Texto completo:http://hdl.handle.net/1822/13911
País:Portugal
Oai:oai:repositorium.sdum.uminho.pt:1822/13911

Texto Completo

http://hdl.handle.net/1822/13911

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