Study of the oxygen role in the photoluminescence of erbium doped nanocrystalline silicon embedded in a silicon amorphous matrix

We have produced and studied erbium doped nanocrystalline silicon thin films with different oxygen and hydrogen content in order to evaluate the influence of the matrix on the Er3+ emission and on the 0.89 eV and 1.17 eV bands. Films were grown by reactive magnetron sputtering on glass substrates un...

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Bibliographic Details
Main Author: Cerqueira, M. F. (author)
Other Authors: Losurdo, M. (author), Monteiro, T. (author), Stepikhova, M. (author), Soares, M. J. (author), Peres, M. (author), Alves, E. (author)
Format: article
Language:eng
Published: 2006
Subjects:
Silicon
Raman scattering
Sputtering
Microcrystallinity
Nanocrystals
Luminescence
Defects
Online Access:http://hdl.handle.net/10773/5654
Country:Portugal
Oai:oai:ria.ua.pt:10773/5654

Internet

http://hdl.handle.net/10773/5654

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