Cristea, D., Crisan, A., Cretu, N., Borges, J. N. P., Lopes, C. J. R., Cunha, L., . . . Munteanu, D. (2015). Structure dependent resistivity and dielectric characteristics of tantalum oxynitride thin films produced by magnetron sputtering.
Chicago Style (17th ed.) CitationCristea, D., et al. Structure Dependent Resistivity and Dielectric Characteristics of Tantalum Oxynitride Thin Films Produced by Magnetron Sputtering. 2015.
MLA (8th ed.) CitationCristea, D., et al. Structure Dependent Resistivity and Dielectric Characteristics of Tantalum Oxynitride Thin Films Produced by Magnetron Sputtering. 2015.
Warning: These citations may not always be 100% accurate.