Determination of deep and shallow levels in conjugated polymers by electrical methods

Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-m...

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Bibliographic Details
Main Author: Stallinga, Peter (author)
Other Authors: Gomes, Henrique L. (author), Rost, H. (author), Holmes, A. B. (author), Harrison, M. G. (author), Friend, R. H. (author), Biscarini, F. (author), Taliani, C. (author), Jones, G. W. (author), Taylor, D. M. (author)
Format: article
Language:eng
Published: 2015
Online Access:http://hdl.handle.net/10400.1/6612
Country:Portugal
Oai:oai:sapientia.ualg.pt:10400.1/6612

Internet

http://hdl.handle.net/10400.1/6612

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