Determination of deep and shallow levels in conjugated polymers by electrical methods

Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-m...

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Detalhes bibliográficos
Autor principal: Stallinga, Peter (author)
Outros Autores: Gomes, Henrique L. (author), Rost, H. (author), Holmes, A. B. (author), Harrison, M. G. (author), Friend, R. H. (author), Biscarini, F. (author), Taliani, C. (author), Jones, G. W. (author), Taylor, D. M. (author)
Formato: article
Idioma:eng
Publicado em: 2015
Texto completo:http://hdl.handle.net/10400.1/6612
País:Portugal
Oai:oai:sapientia.ualg.pt:10400.1/6612
Descrição
Resumo:Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methylthiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techniques were IV, CV, admittance spectroscopy, TSC, capacitance and current transients. (C) 1999 Elsevier Science B.V. All rights reserved.

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