Determination of deep and shallow levels in conjugated polymers by electrical methods

Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-m...

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Bibliographic Details
Main Author: Stallinga, Peter (author)
Other Authors: Gomes, Henrique L. (author), Rost, H. (author), Holmes, A. B. (author), Harrison, M. G. (author), Friend, R. H. (author), Biscarini, F. (author), Taliani, C. (author), Jones, G. W. (author), Taylor, D. M. (author)
Format: article
Language:eng
Published: 2015
Online Access:http://hdl.handle.net/10400.1/6612
Country:Portugal
Oai:oai:sapientia.ualg.pt:10400.1/6612
Description
Summary:Conjugated organic semiconductors have been submitted to various electrical measurement techniques in order to reveal information about shallow levels and deep traps in the forbidden gap. The materials consisted of poly[2-methoxy, 5 ethyl (2' hexyloxy) paraphenylenevinylene] (MEH-PPV), poly(3-methylthiophene) (PMeT), and alpha-sexithienyl (alpha T6) and the employed techniques were IV, CV, admittance spectroscopy, TSC, capacitance and current transients. (C) 1999 Elsevier Science B.V. All rights reserved.

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