Sowade, E., Ramon, E., Mitra, K. Y., Martinez-Domingo, C., Pedro, M., Pallares, J., . . . Baumann, R. R. (2017). All-inkjet-printed thin-film transistors: Manufacturing process reliability by root cause analysis.
Citação norma ChicagoSowade, Enrico, et al. All-inkjet-printed Thin-film Transistors: Manufacturing Process Reliability by Root Cause Analysis. 2017.
Citação norma MLASowade, Enrico, et al. All-inkjet-printed Thin-film Transistors: Manufacturing Process Reliability by Root Cause Analysis. 2017.
Nota: a formatação da citação pode não corresponder 100% ao definido pela respectiva norma.