Sowade, E., Ramon, E., Mitra, K. Y., Martinez-Domingo, C., Pedro, M., Pallares, J., . . . Baumann, R. R. (2017). All-inkjet-printed thin-film transistors: Manufacturing process reliability by root cause analysis.
Chicago Style (17th ed.) CitationSowade, Enrico, et al. All-inkjet-printed Thin-film Transistors: Manufacturing Process Reliability by Root Cause Analysis. 2017.
MLA (8th ed.) CitationSowade, Enrico, et al. All-inkjet-printed Thin-film Transistors: Manufacturing Process Reliability by Root Cause Analysis. 2017.
Warning: These citations may not always be 100% accurate.