X-ray photoelectron spectroscopy: a surface characterization technique

During the last years, an increasing number of students have visited the XPS laboratory for characterizing their samples with this experimental technique. Their background span over a wide range of fields such as physics, material science, chemistry and biology, among others. For most of them, both...

ver descrição completa

Detalhes bibliográficos
Autor principal: Hortigüela Gallo, María J. (author)
Outros Autores: Otero Irurueta, Gonzalo (author)
Formato: book
Idioma:eng
Publicado em: 2019
Assuntos:
Texto completo:http://hdl.handle.net/10773/26343
País:Portugal
Oai:oai:ria.ua.pt:10773/26343
Descrição
Resumo:During the last years, an increasing number of students have visited the XPS laboratory for characterizing their samples with this experimental technique. Their background span over a wide range of fields such as physics, material science, chemistry and biology, among others. For most of them, both XPS and ultra-high vacuum technology were something new and they needed help to deal with the data of their samples. This book tries to concentrate the key information that a young researcher needs for a first approach to XPS. We hope the students will understand its working principle and will obtain the basic tools for analysing their data.