A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs

This poster presents the first truly non-intrusive structural concurrent test approach, with the objective of testing partially and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active C...

Full description

Bibliographic Details
Main Author: Manuel G. Gericota (author)
Other Authors: Gustavo R. Alves (author), Miguel L. Silva (author), José M. Ferreira (author)
Format: book
Language:eng
Published: 2002
Subjects:
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Online Access:https://hdl.handle.net/10216/85005
Country:Portugal
Oai:oai:repositorio-aberto.up.pt:10216/85005

Internet

https://hdl.handle.net/10216/85005

Similar Items