A novel methodology for the concurrent test of partial and dynamically reconfigurable SRAM-based FPGAs

This poster presents the first truly non-intrusive structural concurrent test approach, with the objective of testing partially and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active C...

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Bibliographic Details
Main Author: Manuel G. Gericota (author)
Other Authors: Gustavo R. Alves (author), Miguel L. Silva (author), José M. Ferreira (author)
Format: book
Language:eng
Published: 2002
Subjects:
Engenharia electrotécnica, Engenharia electrotécnica, electrónica e informática
Electrical engineering, Electrical engineering, Electronic engineering, Information engineering
Online Access:https://hdl.handle.net/10216/85005
Country:Portugal
Oai:oai:repositorio-aberto.up.pt:10216/85005
Description
Summary:This poster presents the first truly non-intrusive structural concurrent test approach, with the objective of testing partially and dynamically reconfigurable SRAM-based FPGAs without disturbing their operation. This is accomplished by using a new methodology to carry out the replication of active Configurable Logic Blocks (CLBs), i.e. CLBs that are part of an implemented function that is actually being used by the system, releasing it to be tested in a way that is completely transparent to the system.

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