Characterisation of Ti/Al multilayered structures with slow positron beams applying a simplified positron depth distribution model

This worked was support by the Portuguese Foundation for Science and Technology through the project POCTI/FAT/40924/2001 co-financed by European Union fund FEDER.

Detalhes bibliográficos
Autor principal: Naia, M. Duarte (author)
Outros Autores: Gordo, P. M. (author), Teodoro, O. M. N. D. (author), Lima, A. P. de (author), Moutinho, A. M. C. (author)
Formato: conferenceObject
Idioma:eng
Publicado em: 2019
Assuntos:
Interfaces
Multilayer
SIMS
Slow positron
Thin films
Materials Science(all)
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering
Texto completo:https://doi.org/10.4028/www.scientific.net/MSF.636-637.1097
País:Portugal
Oai:oai:run.unl.pt:10362/76936

Texto Completo

https://doi.org/10.4028/www.scientific.net/MSF.636-637.1097

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