Rolo, A. G., Vasilevskiy, M., Conde, O., & Gomes, M. J. M. (1998). Structural properties of Ge nano-crystals embedded in SiO2 films from X-ray diffraction and Raman spectroscopy.
Chicago Style (17th ed.) CitationRolo, Anabela G., Mikhail Vasilevskiy, O. Conde, and M. J. M. Gomes. Structural Properties of Ge Nano-crystals Embedded in SiO2 Films from X-ray Diffraction and Raman Spectroscopy. 1998.
MLA (8th ed.) CitationRolo, Anabela G., et al. Structural Properties of Ge Nano-crystals Embedded in SiO2 Films from X-ray Diffraction and Raman Spectroscopy. 1998.
Warning: These citations may not always be 100% accurate.