Frequency characterization of memristive devices
This paper proposes a new methodology suitable for frequency characterization of memristive devices (MDs) and systems. MDs are usually described by their associated hysteresis loops. Their distinctive memory properties stem from this unusual characteristic. Understanding the frequency behavior of th...
Autor principal: | |
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Outros Autores: | , |
Formato: | conferenceObject |
Idioma: | eng |
Publicado em: |
1000
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Assuntos: | |
Texto completo: | http://hdl.handle.net/10773/11849 |
País: | Portugal |
Oai: | oai:ria.ua.pt:10773/11849 |