APA (7th ed.) Citation

Cunha, L., Apreutesei, M., Moura, C., Alves, E., Barradas, N. P., & Cristea, D. (2018). In-situ XRD vs ex-situ vacuum annealing of tantalum oxynitride thin films: Assessments on the structural evolution.

Chicago Style (17th ed.) Citation

Cunha, L., M. Apreutesei, C. Moura, E. Alves, N. P. Barradas, and D. Cristea. In-situ XRD Vs Ex-situ Vacuum Annealing of Tantalum Oxynitride Thin Films: Assessments on the Structural Evolution. 2018.

MLA (8th ed.) Citation

Cunha, L., et al. In-situ XRD Vs Ex-situ Vacuum Annealing of Tantalum Oxynitride Thin Films: Assessments on the Structural Evolution. 2018.