Projeto de Malha de Captura de Fase Autocalibrável
The impacts of process variations and intra-die device mismatches of analog and mixed-signal (AMS) circuits, namely regarding fabrication yield, costs, and reliability have become critical with the adoption of deep sub-micron MOS technologies. When in operation, circuits' sensitivity to environ...
| Autor principal: | |
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| Formato: | masterThesis |
| Idioma: | por |
| Publicado em: |
2018
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| Assuntos: | |
| Texto completo: | https://repositorio-aberto.up.pt/handle/10216/115546 |
| País: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/115546 |