Development of hermetic glass frit encapsulation for perovskite solar cells
A hermetic laser-assisted glass frit encapsulation, at a process temperature of 120 degrees C, was developed for perovskite solar cell application. The hermeticity and long-term stability of the sealing was examined based on standard tests for photovoltaic (PV) applications. Encapsulations using flu...
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| Other Authors: | , , , , , |
| Format: | article |
| Language: | eng |
| Published: |
2019
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| Online Access: | https://hdl.handle.net/10216/121084 |
| Country: | Portugal |
| Oai: | oai:repositorio-aberto.up.pt:10216/121084 |
| Summary: | A hermetic laser-assisted glass frit encapsulation, at a process temperature of 120 degrees C, was developed for perovskite solar cell application. The hermeticity and long-term stability of the sealing was examined based on standard tests for photovoltaic (PV) applications. Encapsulations using fluorine doped tin oxide (FTO)-coated glass substrates displayed 8.93 x 10(-8) atm center dot cm(3) center dot s(-1) air leak rate after five cycles of a humidity-freeze test according to the IEC61646 standard; a rate lower than the reject limit of the MIL-STD-883 standard test for fine leaks. Devices sealed with a TiO2 blocking layer and FTO scribing-denoted as an empty perovskite solar cell-showed that the encapsulation is compatible with the various thermal coefficient of expansion regions of perovskite solar cells (PSCs). The applicability of the MIL-STD-883 standard was studied in detail and it was concluded that a new method is required to measure the fine helium leak rate of devices with cavity sizes larger than 5.5 x 5.5 cm(2). The developed sealing process is scalable for larger devices; therefore, it guarantees a new step forward for the industrialization of PSCs. |
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