Casteleiro, C., Schwarz, R., Mardolcar, U., Maçarico, A., Martins, J., Vieira, M., . . . Gomes, H. L. (2014). Spatially-resolved photocapacitance measurements to study defects in a-Si: H based p-i-n particle detectors.
Chicago Style (17th ed.) CitationCasteleiro, C., et al. Spatially-resolved Photocapacitance Measurements to Study Defects in A-Si: H Based P-i-n Particle Detectors. 2014.
MLA (8th ed.) CitationCasteleiro, C., et al. Spatially-resolved Photocapacitance Measurements to Study Defects in A-Si: H Based P-i-n Particle Detectors. 2014.
Warning: These citations may not always be 100% accurate.