Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy
Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to...
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| Outros Autores: | , , , |
| Formato: | article |
| Idioma: | eng |
| Publicado em: |
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| Texto completo: | http://hdl.handle.net/10773/20337 |
| País: | Portugal |
| Oai: | oai:ria.ua.pt:10773/20337 |