Electron and photon stimulated ion desorption from poly(thiophene)

Poly(thiophene) (PT) was studied by the electron (ESID) and photon (PSID) stimulated ion desorption techniques coupled with time-of-flight mass spectrometry (TOF-MS) in order to investigate the response from this semiconducting polymer when submitted to electron and photon beams. Atomic sulfur ions...

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Bibliographic Details
Main Author: Rita,J. R. Santa (author)
Other Authors: Borges,B. G. A. L. (author), Beck,B. (author), Garcia-Basabe,Y. (author), Roman,L. S. (author), Rocco,M. L. M. (author)
Format: article
Language:eng
Published: 2013
Subjects:
poly(thiophene)
semiconducting polymers
electron stimulated ion desorption (ESID)
photon stimulated ion desorption (PSID)
secondary electrons
Online Access:http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532013000400013
Country:Brazil
Oai:oai:scielo:S0103-50532013000400013

Internet

http://old.scielo.br/scielo.php?script=sci_arttext&pid=S0103-50532013000400013

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